Raman spectrum measured for Si/SiO2 sample, excitation …
Three spectra can be recognized in SiO 2 analysis via Raman: the main band placed between 300 cm −1 to 550 cm −1 for crystalline, D2 band around 620 cm −1 , and another band with a …
Raman spectroscopy on SiO2 glasses sintered from nanosized …
2003年7月15日 · Raman spectroscopy is well suited to obtaining the information on the structure of sintered SiO 2 materials. The vibrational Raman bands of v-SiO 2 can be associated with …
Raman spectra of metallic Si, SiO2 polymorphs and amorphous SiO2.
Raman spectra of metallic silicon (Si), silica polymorphs and amorphous SiO2 (glass) are showed in Figure 10. The first-order Raman spectrum yields energies for the k = 0 optical modes of...
SiO2 raman spectrum | Raman for life - RamanLife
Raman spectroscopy is a powerful, nondestructive tool commonly applied to characterize SiO 2 films. Since Raman scattering in thin films is significantly affected by optical interference, the …
Density-Functional Study of the Si/SiO2 Interfaces in Short-Period ...
2023年8月4日 · Raman spectroscopy has proven its effectiveness as a highly informative and sensitive method for the nondestructive analysis of layered nanostructures and their …
Raman Spectroscopy of Si O 2 Glass at High Pressure
1986年8月11日 · A new technique has been developed for optical studies of amorphous solids to very high pressures. Raman spectra of Si${\mathrm{O}}_{2}$ glass measured at 8 GPa …
Temperature-dependent Raman spectroscopy studies of 1–5
2020年2月13日 · In this work, Raman measurements of 1–5-layer WSe 2 supported on SiO 2 /Si in the temperature range of 133 to 533 K are reported. A physical model including both volume …
Interference‐enhanced Raman scattering in SiO2/Si structures …
2019年8月13日 · We derived a theoretical model, which was experimentally tested on simple structures consisting of SiO 2 deposited on mono-Si substrates. In agreement between the …
An all-silicon Raman laser - Nature
2005年1月5日 · This demonstration of Raman lasing in a silicon waveguide cavity on a single chip represents a significant step towards a more practical, all-silicon-based, c.w. amplifier or laser.
Raman spectroscopic characterization of SiO2 phase ... - ACerS
2023年5月10日 · In this study, Raman micro-spectroscopy was used to quantify the cristobalite transformation on a polycrystalline Si coupon that was exposed to steam at 1350°C for 100 h. …